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Title: Optical-beam profiling by bias-controlled metal-semiconductor-metal structures
Authors: Sanya Khunkhao
Keywords: Optical-beam
Issue Date: 22-June-2006
Publisher: APAC-SILICIDE 2006
Citation: Asia-Pacific Conference on Semiconducting Silicides : Science and Technology
Abstract: Recently we have shown experimentally that a planar metalsemiconductor- metal(MSM) structure having a wide separation between the two metal electrodes exhibits not only the function of a basic optical sensor but also optical sensitivity field-controllable by the bias applied [I]. In this study, we present the experimental results of onedimensional (ID) optical-beam profiling properties of an MSM structure as its application. To our knowledge, no study has appeared on such an application of planar MSM structures.
Appears in Collections:EGI-04. บทความที่ประชุมวิชาการ (ระดับนานาชาติ)

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