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|Title:||Optical-beam profiling by bias-controlled metal-semiconductor-metal structures|
|Citation:||Asia-Pacific Conference on Semiconducting Silicides : Science and Technology|
|Abstract:||Recently we have shown experimentally that a planar metalsemiconductor- metal(MSM) structure having a wide separation between the two metal electrodes exhibits not only the function of a basic optical sensor but also optical sensitivity field-controllable by the bias applied [I]. In this study, we present the experimental results of onedimensional (ID) optical-beam profiling properties of an MSM structure as its application. To our knowledge, no study has appeared on such an application of planar MSM structures.|
|Appears in Collections:||EGI-04. บทความที่ประชุมวิชาการ (ระดับนานาชาติ)|
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