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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Sanya Khunkhao | en_US |
dc.date.accessioned | 2555-08-04T15:47:26Z | - |
dc.date.available | 2555-08-04T15:47:26Z | - |
dc.date.issued | 2006-06-22 | - |
dc.identifier.citation | Asia-Pacific Conference on Semiconducting Silicides : Science and Technology | en_US |
dc.identifier.uri | http://dspace.spu.ac.th/handle/123456789/3777 | - |
dc.description.abstract | Recently we have shown experimentally that a planar metalsemiconductor- metal(MSM) structure having a wide separation between the two metal electrodes exhibits not only the function of a basic optical sensor but also optical sensitivity field-controllable by the bias applied [I]. In this study, we present the experimental results of onedimensional (ID) optical-beam profiling properties of an MSM structure as its application. To our knowledge, no study has appeared on such an application of planar MSM structures. | en_US |
dc.language.iso | other | en_US |
dc.publisher | APAC-SILICIDE 2006 | en_US |
dc.subject | Optical-beam | en_US |
dc.title | Optical-beam profiling by bias-controlled metal-semiconductor-metal structures | en_US |
dc.type | Article | en_US |
Appears in Collections: | EGI-04. บทความที่ประชุมวิชาการ (ระดับนานาชาติ) |
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