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http://dspace.spu.ac.th/handle/123456789/822
Title: | Optical-beam profiling by bias-controlled metal-semiconductor-metal structures |
Authors: | Sanya Khunkhao |
Issue Date: | 29-July-2006 |
Publisher: | APAC-SILICIDE 2006 |
Citation: | Asia-Pacific Conference on Semiconducting Silicides : Science and Technology |
Abstract: | Recently we have shown experimentally that a planar metalsemiconductor- metal(MSM) structure having a wide separation between the two metal electrodes exhibits not only the function of a basic optical sensor but also optical sensitivity field-controllable by the bias applied [I]. In this study, we present the experimental results of onedimensional (ID) optical-beam profiling properties of an MSM structure as its application. To our knowledge, no study has appeared on such an application of planar MSM structures. |
URI: | http://dspace.spu.ac.th/handle/123456789/822 |
Appears in Collections: | บทความวิชาการ |
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