Sanya Khunkhao2555-08-042555-08-042549-06-22Asia-Pacific Conference on Semiconducting Silicides : Science and Technologyhttps://dspace.spu.ac.th/handle/123456789/3777Recently we have shown experimentally that a planar metalsemiconductor- metal(MSM) structure having a wide separation between the two metal electrodes exhibits not only the function of a basic optical sensor but also optical sensitivity field-controllable by the bias applied [I]. In this study, we present the experimental results of onedimensional (ID) optical-beam profiling properties of an MSM structure as its application. To our knowledge, no study has appeared on such an application of planar MSM structures.otherOptical-beamOptical-beam profiling by bias-controlled metal-semiconductor-metal structuresArticle