Sanya Khunkhao2551-02-222551-02-222549-07-29Asia-Pacific Conference on Semiconducting Silicides : Science and Technologyhttps://dspace.spu.ac.th/handle/123456789/822Recently we have shown experimentally that a planar metalsemiconductor- metal(MSM) structure having a wide separation between the two metal electrodes exhibits not only the function of a basic optical sensor but also optical sensitivity field-controllable by the bias applied [I]. In this study, we present the experimental results of onedimensional (ID) optical-beam profiling properties of an MSM structure as its application. To our knowledge, no study has appeared on such an application of planar MSM structures.en-USOptical-beam profiling by bias-controlled metal-semiconductor-metal structuresArticle