Optical-beam profiling by bias-controlled metal-semiconductor-metal structures
| dc.contributor.author | Sanya Khunkhao | |
| dc.date.accessioned | 2551-02-22T08:30:05Z | |
| dc.date.available | 2551-02-22T08:30:05Z | |
| dc.date.issued | 2549-07-29 | |
| dc.description.abstract | Recently we have shown experimentally that a planar metalsemiconductor- metal(MSM) structure having a wide separation between the two metal electrodes exhibits not only the function of a basic optical sensor but also optical sensitivity field-controllable by the bias applied [I]. In this study, we present the experimental results of onedimensional (ID) optical-beam profiling properties of an MSM structure as its application. To our knowledge, no study has appeared on such an application of planar MSM structures. | en_US |
| dc.description.sponsorship | Sponsored by Professional Group on Semiconducting Silicides and Related Materials of The Japan Society of Applied Physics | en_US |
| dc.identifier.citation | Asia-Pacific Conference on Semiconducting Silicides : Science and Technology | en_US |
| dc.identifier.uri | https://dspace.spu.ac.th/handle/123456789/822 | |
| dc.language.iso | en_US | en_US |
| dc.publisher | APAC-SILICIDE 2006 | en_US |
| dc.title | Optical-beam profiling by bias-controlled metal-semiconductor-metal structures | en_US |
| dc.type | Article | en_US |