Optical-beam profiling by bias-controlled metal-semiconductor-metal structures
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วันที่
2549-06-22
ผู้เขียน
ชื่อวารสาร
วารสาร ISSN
ชื่อหนังสือ
สำนักพิมพ์
APAC-SILICIDE 2006
เชิงนามธรรม
Recently we have shown experimentally that a planar metalsemiconductor- metal(MSM) structure having a wide separation between the two metal electrodes exhibits not only the function of a basic optical sensor but also optical sensitivity field-controllable by the bias applied [I]. In this study, we present the experimental results of onedimensional (ID) optical-beam profiling properties of an MSM structure as its application. To our knowledge, no study has appeared on such an application of planar MSM structures.
คำอธิบาย
คำหลัก
Optical-beam
การอ้างอิง
Asia-Pacific Conference on Semiconducting Silicides : Science and Technology